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DI Nanoscope Ⅳ型扫描探针显微镜

作者:        发布于:2010-09-11

  

    型号:DI Nanoscope

  国别、厂家美国维易科精密仪器有限公司

  基本功能原子力显微镜(AFM),扫描隧道显微镜(STM)

  成像模式:接触模式、轻敲模式、相位成像模式、液体环境下成像模式、横向力/摩擦力显微镜、磁力显微镜、静电力显微镜

  主要技术指标:

    样品尺寸:直径<15mm,厚度<5mm

    横向分辨率:<0.2nm

    扫描范围:(x,y10μm/125μm,(z2.5μm/5μm

    扫描探针显微镜是几种以检测探针与样品间相互作用为特征的显微镜的总称。

  

  工作原理:使用一个一端固定而另一端装有针尖的弹性微悬臂来检测样品表面形貌或其它表面性质。当针尖和样品靠近时,它们之间的作用力会引起微悬臂发生形变,一束激光照射到微悬臂的背面,微悬臂将激光束反射到光电检测器,微悬臂的微小变化会引起激光束在光电检测器上的较大位移,然后产生可测量的电压差,通过测量检测器电压对应样品扫描位置的变化,就可得到样品的表面形貌和其相对应的力、电、磁等物性信息。广泛用于材料、生命科学及聚合物的研究。

  可获得的信息:

     1、 薄膜、纳米材料、生物材料或块体材料(d1cmh5mm,表面粗糙度4um)的表面形貌,立体形貌,section分析,粗糙度信息,颗粒度分析等结果;

     2、 磁性材料的形貌和磁畴结构;

     3、 铁电、压电材料的形貌、电畴结构和表面电势分布;

     4、 纳米压痕计算材料的微观硬度;

     5、 液态模式下测量样品的微观形貌;

     6、 力曲线的测试,可得表面微观硬度、弹性模量、杨氏模量及黏度等信息。

  

  

  Model: DI Nanoscope

  Manufacturer: Veeco, USA

  Function: AFM, STM

  Imaging mode: Contact mode, Tapping mode, Phase imaging, Lateral force microcopy, Magnetic force microcopy, Electric force microcopy

  Specification:

    Sample size: <15mm in diameter;  <5mm in thickness

     Lateral resolution: <0.2nm

      Scan size: x,y10μm/125μm,(z2.5μm/5μm

    SPM consists of a family of microscopy forms where a sharp probe is scanned across a surface and some interactions between the probe and sample are monitored. AFM operates by scanning a tip attached to the end of a cantilever across the sample surface while monitoring the change in cantilever deflection with a split photodiode detector. The reflected laser beam is deflected in a regular pattern over a photodiode array, generating a sinusoidal electronic signal. It reveals informations about the vertical height of the sample surface and some characteristics (include elasticity, magnetic, and electric forces) of the sample material itself. AFM has a broad applications in materials, life science, and polymers research.

  

  

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